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Enhance Atomic Force Microscope (AFM) with Chemical Signature

|   Event

presented by Joao-Lucas RANGEL, HORIBA France

Event

Beginning: 07/11/24

Location: Online

The combination of complementary imaging techniques provides an extensive understanding of complex samples and mixtures, revealing the local property variations. However, the combination of different modalities can become very complex, non-colocalized, not in real time and requires a considerable level of sample handling by moving the sample among different instruments. To mitigate all the inconveniences, a true colocalized approach must be considered.

SignatureSPM, the first multimodal characterization system built on an automated Atomic Force Microscope platform and integrating a Raman/Photoluminescence spectrometer, enables true colocalized measurements of physical and chemical properties. Raman spectroscopy, within this colocalized approach, provides essential data about the molecular structures and compositions, including potential contaminants at microscale. Simultaneously, AFM contributes information about the topographical and mechanical properties of the samples, offering detailed data into their surface textures, surface adhesion, roughness, and stiffness at nanoscale.

While users usually need to combine several instruments, trying to extract a comprehensive information about their sample, the SignatureSPM approach distinguishes itself as a uniquely multimodal system, providing clear and correlated understanding of the studied specimen through a reliable, real time and fast scanning.

Key Learning Objectives

  • Understand the benefits of the true colocalized measurement combining an automated AFM with chemical information
  • Explore the application domains that can be investigated by SignatureSPM
  • How SignatureSPM integrated design can support your research with less sample handling, real time analysis and reliable correlation
     

Who should attend?

  • Researchers from academia and industries who are looking for a fully integrated solution that combines AFM and chemical insights
  • AFM researchers who are missing colocalized chemical information about their samples
  • Researchers who are looking for a true correlated results between the different sample properties without any compromise on the instrument performance
     

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