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Scientific

Glow Discharge Optical Emission Spectrometry (GDOES)

Pulsed RF GDOES instrumentation

GDOES is an analytical technique that provides ultra-fast elemental depth profile analysis of layered materials, simultaneously offering quantitative measurement of all elements and thickness with nanometer depth resolution. HORIBA Scientific's pulsed RF GDOES instruments, with Differential Interferometry Profiling (DiP), are the ideal companion characterization tools for material research and process elaboration.

The innovative pulsed RF source allows profiling of all types of solid samples with optimum performance, from the first nanometer, to more than 150μm. Polymeric materials are easily sputtered with patented Ultra Fast Sputtering (UFS). In addition, this source can also be used to prepare sample surfaces for Scanning Electron Microscopy (SEM).

All elements can be measured, including Hydrogen, Deuterium, Lithium, Carbon, Nitrogen, Oxygen, and more.

The patented Differential Interferometry Profiling (DiP) allows direct measurement of the depth as a function of time, with nanometric precision, which is performed simultaneously with the GD analysis.

The patented High Dynamic range Detectors (HDD) used in all HORIBA Scientific GD instruments, allow real time, automatic optimization of the sensitivity, to analyze elements at trace levels in one layer, and as major in a second layer without compromise or need to make any adjustments.

GD-Profiler 2?

The GD-Profiler 2? provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin and thick films characterization and process studies.

Trainings



Our trainers are experts in GDOES. They will provide trainings advice and guidance to make the most of your HORIBA Scientific instrument.
You will gain confidence and experience in the analysis of your samples.

Technology & F.A.Q.

Glow Discharge Optical Emission Spectroscopy (GDOES)

GDOES is an analytical technique that provides both the surface/depth profile and the bulk elemental composition of solid materials and layers quickly, and with high sensitivity to all elements. Read more about this technique and its wide range of applications.

Elemental Analysis in Action

Welcome to Science in Action. Our new series showcasing how our technologies, scientists, design and software engineers, and solutions are applied to real-world situations

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Featured

Combined Pulsed RF GD-OES and HAXPES for Quantified Depth Profiling through Coatings

The combination between pulsed GD OES and XPS, notably to look at embedded interfaces, is generating interest from the Surface community. Look at this open Access article published in Coatings.

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New GD-Profiler 2? Brochure Available

Discover the new brochure for the GD-Profiler 2?, our Pulsed RF Glow Discharge Optical Emission Spectrometer, with Differential Interferometry Profiling (DiP) information and the latest functionalities and applications.

Get the brochure

Novel Porous Phosphorus–Calcium–Magnesium Coatings on Titanium with Copper or Zinc Obtained by DC Plasma Electrolytic Oxidation: Fabrication and Characterization

In this paper, the characteristics of new porous coatings fabricated at three voltages in electrolytes based on H3PO4 with calcium nitrate tetrahydrate, magnesium nitrate hexahydrate, and copper(II) nitrate trihydrate are presented. The SEM, energy dispersive spectroscopy (EDS), glow discharge optical emission spectroscopy (GDOES), X-ray photoelectron spectroscopy (XPS), and XRD techniques for coating identification were used.

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Real-time depth measurement in glow discharge optical emission spectrometry via differential interferometric profiling

We developed an in situ measurement technique implemented on a Glow Discharge Optical Emission Spectrometry (GDOES) instrument, which provides the depth information during the profiling process. The setup is based on a differential interferometer, and we show that a measurement accuracy better than 5% can be obtained for crater depths ranging from 100 nanometers to several tens of micrometers. This development can be directly applied to non-transparent coatings, and brings significant improvement to the quantification process in GDOES.

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Studying perovskite solar cells with HORIBA Scientific equipment

With their ~20 % efficiency, hybrid perovskite solar cells are the new promising candidate for next generation photovoltaics. Thanks to the wide HORIBA Scientific portfolio, different techniques can be used to gain in depth knowledge on the optoelectronic properties and mechanisms of this class of materials. In this application note we decided to use spectroscopic ellipsometry, steady-state and time-resolved fluorescence and Glow Discharge Optical Emission Spectroscopy to investigate the properties of CH3NH3PbI3 thin films deposited on a spin-coated PEDOT:PSS. The impact of the exposure to air was addressed.

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MoS2/Pb nanocomposite coatings for solid lubricants application

Pulsed RF Glow Discharge Optical Emission Spectrometry offers ultra-fast elemental depth profiling capability for the investigation of thin and thick films. Thanks to the use of a pulsed RF source, coupled with a high resolution optical spectrometer, the GD Profiler 2 provides an excellent depth resolution, allowing the fast evaluation of the coating quality. In this application note, we focus on a MoS2/Pb composite multilayered sample, used as a solid lubricant. The analysis of such a sample shows the excellent performance of this instrument for the study of nm-thick complex coatings.

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GD-Profiler 2?
GD-Profiler 2™

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